*Fast Scanning Transmission X-ray Microscopy: Enabling New Science Today
and at the ALS-U*
Dr. Alex Ditter (LBNL)
*Thursday November 21*: 9am Seattle; 11am Saskatoon; 12 noon New York; 2pm
Rio de Janeiro; 5pm London; 6pm Berlin; 7pm Cape Town; 8pm Amman; 2am
(11/22) Tokyo; 4am (11/22) Melbourne
*link*: https://urldefense.us/v3/__https://washington.zoom.us/j/95725226444__;!!G_uC...
*password*: EXAFS
Many recent and planned upgrades to lightsources around the world are
focused on improving emittance and maximizing coherent flux.1 Scanning
Transmission X-ray Microscopes (STXMs) and ptychography beamlines can use
these improvements only if detector speed, scanning speed, data pipelines,
and data analysis tools are able to keep up. We will discuss here a brief
overview of Advanced Light Source (ALS) Beamline 7.0.1.22, 3 and focus on
recent developments in improving scanning speed. This is accomplished
through the implementation of a spiral scan pattern originally developed
for atomic force microscopy,4 and which improves scanning time by a factor
of 3-5. This not only improves throughput but also enables new science as
demonstrated by large population particle measurements and the observation
of in situ dynamics on the time scale of seconds. We will also discuss how
fast scanning will tie into other beamline improvements planned for the ALS
upgrade.
1. Kevan, S., Robin, D., Falcone, R., Ralston, C., Zwart, P., Adams, P.,
Gilbert, B., Nico, P., Gilbert, P., Hexemer, A., Russell, T., Liu, Y.,
Bluhm, H., Guo, J., Rotenberg, E., Weber-Bargioni, A., Arenholz, E.,
Scholl, A., White, A., Mayra, R., and Rostomian, Z., ALS-U: Solving
Scientific Challenges with Coherent Soft X-rays. 2017.
2. Celestre, R., Nowrouzi, K., Shapiro, D.A., Denes, P., Joseph, J.M.,
Schmid, A., and Padmore, H.A., Nanosurveyor 2: A Compact Instrument for
Nano-Tomography at the Advanced Light Source. Journal of Physics:
Conference Series, 2017. 849(1): p. 012047 DOI:
10.1088/1742-6596/849/1/012047.
3. Shapiro, D.A., Babin, S., Celestre, R.S., Chao, W., Conley, R.P., Denes,
P., Enders, B., Enfedaque, P., James, S., Joseph, J.M., Krishnan, H.,
Marchesini, S., Muriki, K., Nowrouzi, K., Oh, S.R., Padmore, H., Warwick,
T., Yang, L., Yashchuk, V.V., Yu, Y.-S., and Zhao, J., An
ultrahigh-resolution soft x-ray microscope for quantitative analysis of
chemically heterogeneous nanomaterials. Science Advances, 2020. 6(51): p.
eabc4904 DOI: doi:10.1126/sciadv.abc4904.
4. Ziegler, D., Meyer, T.R., Amrein, A., Bertozzi, A.L., and Ashby, P.D.,
Ideal Scan Path for High-Speed Atomic Force Microscopy. IEEE/ASME
Transactions on Mechatronics, 2017. 22(1): p. 381-391 DOI:
10.1109/TMECH.2016.2615327.
--
*Gerald Seidler*
*Professor, Physics Department*
*University of Washington*
*https://urldefense.us/v3/__http://faculty.washington.edu/seidler/index.html_...
<https://urldefense.us/v3/__http://faculty.washington.edu/seidler/index.html_... >*
*seidler@uw.edu