I was curious to tap the collective wisdom of those on the list regarding the "true meaning" of S02, the passive electron reduction factor, at least with regards to fitting experimental data to feff calculated paths. I understand that S02 is an aggregate "energy losses related to core hole creation parameter", but am curious about experimental data fitting. In particular, I have have started probing both high and low energy ranges for exafs and find that my usual experience from the 10-15 keV range don't seem to apply. In particular, I have been measuring energies around the O edge (540 eV) as well as some rather high energies edges Te (31 keV), Cd (26.7 keV) etc.. I have heard (indirectly via my coworker) from Andrei Rogalev that he considers S02 to be just another parameter. As the correlation between S02 and N is unity, this leads to a fair amount of ambiguity in the determination of coordination to say the least. While we are on the subject, are there any general observations about the transferablility of S02 from standards. How about the expected temperature dependence of S02? I do recall reading from John Rehr's article in RMP that S02 (which feff does calculate by the way) is an path dependent, complex sum that must be phasor summed. What are some realistic approximations/trends regarding to S02 and temperature, energy, and/or structure dependence? Dr. Paul Fons Senior Researcher National Institute for Advanced Industrial Science & Technology METI Optoelectronics Division Umezono 1-1-4 Tsukuba, Ibaraki JAPAN 305-8568
Hi Paul,
I was curious to tap the collective wisdom of those on the list regarding the "true meaning" of S02, the passive electron reduction factor, at least with regards to fitting experimental data to feff calculated paths.
It may be (?) that the "meaning" of S02 from fits may differ from
the "true meaning" from a theoretical perspective. Luke Campbell
looked at this question in his thesis work [see "Interference between
Extrinsic and Intrinsic Losses in XAFS," L. Campbell, L. Hedin, J. J. Rehr,
and W. Bardyszewski, Phys. Rev. B 65, 064107 (2002)], and found
that, as had been anticipated, S02 is only weakly energy and path dependent.
The work also found that the intrinsic loss estimate for S02, i.e. the
many body overlap integral |
standards. How about the expected temperature dependence of S02? I do
I think the temperature dependence should be very weak. Mosly the path dependence is in a correction to the mean free path. I'll be curious to see what others say about S02 especially fixing the edge jump or fitting ei rather than S02 or both ei and S02. Cheers, John Rehr
Thanks John for the informative comment. One of the main reasons, I brought up the topic (in order to hear others perspective) is that I noticed that the Te edge (in GST and AIST -- dvd recording media) has very small oscillations and I have read an (experimental) paper attributing it to multiple electron excitation. In the data I have looked at so far, S02 seems to want to be 0.5 or 0.6. This is in contract to the Sb (right next to the Te edge) which has much larger oscillations. Certainly I would agree that 0.9 +- 0.1 is a typically value for the middle energy range in my experience (5-20 keV), but there are apparently exceptions -- hence my desire to hear others experiences. Paul
participants (2)
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Dr. Paul Fons
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John J. Rehr