Re: [Ifeffit] Ifeffit Digest, Vol 159, Issue 3
Dear All, Matteo
It is difficult to do post facto, but if you have a well-defined solid, foil or crystal then mapping the thickness, measuring the mass and hence determining the mass per unit area, for the exact region illuminated by the beam, provides accurate units. Usually you will need to make a measurement of the average m/A from (i) total mass and (ii) total area, and then (iii) map the whole sample with X-ray tomography and (iv) the region illuminated by the X-ray beam.
We have a series of papers which explain more than one methodology for doing that within the XERT technique. If your sample is a solution it is a bit more tricky, and I would refer you to recent JSR and JPCC papers for our Hybrid technique. Both can work well but need a bit more care than a normal XAFS measurement.
Best wishes
Chris
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Christopher Chantler, Professor, FAIP
Editor-in-Chief, Radiation Physics and Chemistry
Chair, International IUCr Commission on XAFS
President, International Radiation Physics Society
School of Physics, University of Melbourne
Parkville Victoria 3010 Australia
+61-3-83445437 FAX +61-3-93474783
chantler@unimelb.edu.au chantler@me.com
http://optics.ph.unimelb.edu.au/~chantler/xrayopt/xrayopt.html
http://optics.ph.unimelb.edu.au/~chantler/home.html
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From: Ifeffit [ifeffit-bounces@millenia.cars.aps.anl.gov] on behalf of ifeffit-request@millenia.cars.aps.anl.gov [ifeffit-request@millenia.cars.aps.anl.gov]
Sent: Saturday, 14 May 2016 3:00 AM
To: ifeffit@millenia.cars.aps.anl.gov
Subject: Ifeffit Digest, Vol 159, Issue 3
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Today's Topics:
1. How to assign measure unit to XAFS data (Matteo Busi)
2. Re: How to assign measure unit to XAFS data (Alexey Boubnov)
3. Re: How to assign measure unit to XAFS data (Matt Newville)
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Message: 1
Date: Fri, 13 May 2016 02:11:39 +0200
From: Matteo Busi
participants (1)
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Christopher Thomas Chantler