Hi Alex, I have make Al K-edge measurements before. Unfortunately, the beamline is no longer available. It was Jumbo (BL III-3) at SSRL. At least, I don't think that Jumbo came back after the upgrade. I have made Total Electron Yield, Partial Electron Yield (Auger), and Fluorescence measurements on both conductive and non-conductive samples. I used an AXUV300 diode from http://www.ird-inc.com/axuvabsdev/axuv300mg.html. The diode is visible light sensitive so either the chamber must be light tight or it must be covered by 1 um of Al. I got the Al foil from Lebow http://www.lebowcompany.com/. This will certainly work for you if you can find a beamline, if I remember we used the YB66 crystals at Jumbo. You might contact the SRC to see if the Canadian Double Crystal monochromator can go low enough to catch Al. You are correct that the sample needs to be vacuum compatible. A low energy Ge detector with a thin C window should be able to detect Al as well. Jeff Jeff Terry Assoc. Professor of Physics Life Science Bldg Rm 166 Illinois Institute of Technology 3101 S. Dearborn St. Chicago IL 60616 630-252-9708 terryj@iit.edu On Oct 11, 2011, at 9:47 AM, Kompch, Alexander wrote:
Dear all,
for the analysis of the location of the Al-dopant in ZnO, I am looking for suitable EXAFS beamlines. Dopant concentrations are 1-10%. So far I have only found ALS 6.3.1 and NSLS X15B. Can anybody recommend beamlines for Al EXAFS?
My EXAFS experience is so far limited to the high energy range with signal detection in transmission (ionization chambers) and fluorescence (multi-element Ge-detectors). At such low energies as 1.5 keV for Al-K, the sample needs to be in vacuum, transmission will not work and Ge detectors probably the same. Does anybody have experience with Al-EXAFS, and can share a little about setup and what other complications to expect?
Thank you, Alex. _______________________________________________ Ifeffit mailing list Ifeffit@millenia.cars.aps.anl.gov http://millenia.cars.aps.anl.gov/mailman/listinfo/ifeffit