Hi Joseph: On Fri, 17 Oct 2008, Joseph Washington wrote:
Hello all, I am working on analyzing Ge edge EXAFS data of an annealed sample which is likely to be Ge-Te crystallites with some amorphous material at the grain boundary (or perhaps, just Ge-N crystal material at the interface). I do not have any information about the grain size, only possible constituents for the grain and the boundary. Can anyone give me some examples of how Artemis might handle this?
It would help to know what it is that you are after in this analysis. What do you know about the two different kinds of environments? Do you hve endpoints for the crystalline material and the amorphous one? Carlo -- Carlo U. Segre -- Professor of Physics Associate Dean for Special Projects, Graduate College Illinois Institute of Technology Voice: 312.567.3498 Fax: 312.567.3494 segre@iit.edu http://www.iit.edu/~segre segre@debian.org