On 01/03/2017 03:32 PM, Raj kumar wrote:
From XRD, it is confirmed that there is no side phase formation and contamination. Hence, i guess the heavier element role could be avoided here.
Raj, While this might be true for your sample, in general, a statement like this always concerns me. From XRD, you can say is that there is no /crystalline/ side phase formation and that there is no contamination in the /diffracting/ /portion/ of the sample. It is very common when preparing nanoparticulate matter for there to be non- or poorly-diffracting content in the sample. If that content contains the absorbing element, then it will have an impact on the XAS data. B -- Bruce Ravel ------------------------------------ bravel@bnl.gov National Institute of Standards and Technology Synchrotron Science Group at NSLS-II Building 743, Room 114 Upton NY, 11973 Homepage: http://bruceravel.github.io/home/ Software: https://github.com/bruceravel Demeter: http://bruceravel.github.io/demeter/