Hi all, I'm in the process of preparing a proposal for a project, part of which will entail taking a practical look at basic issues in EXAFS curve-fitting to theoretical standards. These issues are the kind of thing that are now handled anecdotally; I'd like to do some careful studies of what the benefits and drawbacks of various schemes in use really are. To keep this from getting too broad, my focus is primarily on nanoparticle oxides (the area where I've done the most work), but many of these questions will come up while fitting a wide variety of materials. Here are some examples of the kind of issues I'd like to consider: Choosing a measurement uncertainty for computing chi-square Multiple-scattering constraint schemes Ei--is a non-zero value helpful in these fits? Third cumulant--is a non-zero value helpful in these fits? Nanoparticle size-determination schemes Debye-Waller factor constraint schemes Fourier transform issues (e.g. windowing) I'd like to hear any suggestions any of you have for additions to this list. Basically, I'm looking for issues that we all have to deal with in routine fits, but are currently dealt with differently by different researchers. --Scott Calvin Sarah Lawrence College