That method only works at one energy, and assumes something about the width of the V2O5 feature. Another possible method might be
to measure, in back-reflection, a high-order Bragg reflection from a Si crystal. For instance, the 555 reflection would be at
9.9keV. If you put up a 111 Si crystal and did a transmission scan, maybe you could detect the reflection as a transmission dip.
You would then play with the orientation of the crystal so that the energy at which this dip occurred was as low as possible,
meaning that you were at back-reflection. This condition is useful because it gives the least sensitivity to beam divergence. You
could then calculate the Darwin broadening of the 555 reflection to correct the observed value. By choosing different reflections,
you could measure the resolution at different energies. Of course, I haven't tried this myself.
mam
----- Original Message -----
From: "Bruce Ravel"
On Wednesday 05 May 2010 02:12:38 pm M Ceolin wrote:
Hi all.
I would like to know if anyone knows an experimental method to determine the energy resolution in the XANES region of a XAS spectrum. I do not explored the previous entries in the list so I beg you pardon if it was already discussed. Thank you for the information.
Hi Marcelo,
A few years back the folks at the APS used the method described about half-way down the page at:
http://xafs.org/APSXAFS/APS_XOR_Eval
One example evaluation is shown at
http://xafs.org/APSXAFS/APS_XOR_Eval/20BM/EResolution
HTH, B
--
Bruce Ravel ------------------------------------ bravel@bnl.gov
National Institute of Standards and Technology Synchrotron Methods Group at NSLS --- Beamlines U7A, X24A, X23A2 Building 535A Upton NY, 11973
My homepage: http://xafs.org/BruceRavel EXAFS software: http://cars9.uchicago.edu/~ravel/software/exafs/ _______________________________________________ Ifeffit mailing list Ifeffit@millenia.cars.aps.anl.gov http://millenia.cars.aps.anl.gov/mailman/listinfo/ifeffit