To add to Fred's comments, as someone who has done a lot of soft x-ray spectroscopy, there is simply not enough "room" above the edge to do EXAFS at these energies. There is a lot of competition from molecular resonances and other light elements. For instance, the feature around 290 eV is due to a 1s --> sigma^* transition. Also, the feature at ~400 eV could as likely originate from some spurious nitrogen in your system than photoelectron scattering. Carbon NEXAFS is well established to look at the bonding and chemistry of SAMs, graphene, diamond, etc. I suggest you search that out. Jo Stohr has a good book on the subject (http://www-ssrl.slac.stanford.edu/stohr/). Also, I would highly recommend getting better quality data. Even with SLG you should be able to count for an appreciable time to get higher quality data. This will reveal a lot of the resonances you see in carbon, and will allow your angle dependent measurements to be more quantifiable. (I assume you are doing angle dependence to probe the orientation of the graphene on whatever substrate you have). Best regards, Rob Meulenberg -- Robert W. Meulenberg Associate Professor of Physics Laboratory for Surface Science and Technology Department of Physics and Astronomy University of Maine Orono, ME 04469 phone: 207-581-2245 email: robert.meulenberg@maine.edu