Advanced Methods and Tricks of EXAFS Data Modeling
Workshop at the Annual NSLS Users' Meeting
Wednesday, May 23, 2001.
Workshop organizer:
Anatoly Frenkel
Physics Department, Yeshiva University, New York, NY 10016
With the development of the ab initio theories and data analysis techniques,
EXAFS method is evolving in a routine materials characterization method, on a par
with other well established structural techniques.
The goal of this workshop is to demonstrate how to make the most use of
the experimental EXAFS signal via smart modeling (beyond the trivial first-shell
analysis) and yet not to overinterpret
the data.
In addition, many common mistakes in the data analysis
and some common examples of unphysical interpretations of the data,
which are often overlooked, will be discussed.
The workshop is intended for the broad audience of synchrotron users from all
fields of materials science, physics, chemistry, biology, environmental
science, engineering etc. who specialize in EXAFS.
The brief report about the workshop is published in Synchrotron Radiation News and
available here .
Workshop talks
(Follow the links below to download the abstracts or the entire
presentations)