[Ifeffit] XRS workshop 2019

[Christoph Sahle]

Dear Colleagues,

We cordially invite you to attend the Workshop entitled “X-ray Raman 
scattering spectroscopy -
Probing low Z elements using hard X-rays” that will be hosted at the 
ESRF (Grenoble, France) from 3 to 5 April 2019.

Aim and Scope of the workshop:
Non-resonant inelastic X-ray scattering from core-electrons, or X-ray 
Raman scattering (XRS) spectroscopy, is an increasingly popular 
spectroscopic tool to investigate low energy absorption edges using hard 
X-rays. The aim of the proposed workshop is to bring together experts 
and novices in the field of XRS spectroscopy. We will assess and discuss 
the current status, potential, and future prospects for this emerging 
inelastic x-ray scattering technique. The interest in XRS is rapidly 
growing and new end-stations are being designed at 3rd generation 
synchrotron light sources around the world. The focus of this workshop 
will be to strengthen the user community, define future research 
directions and guide the worldwide efforts to build new dedicated 
end-stations for X-ray Raman scattering spectroscopy.

The workshop will consist of contributed talks with ample time reserved 
for questions and discussion as well as a poster session. The workshop 
is open to all interested parties, but the number of participants will 
be limited to approximately 50.

The workshop will be divided into 6 sessions:

     Instrumentation
     Low-Z elements under extreme conditions
     Soft condensed matter, statistical systems
     Correlated electron systems
     Direct tomography imaging
     Theoretical approaches

You can find more information about this event on the web page 
(including a link to the registration)

[http://www.esrf.fr/xrs-workshop].

Kind regards,

Ch. Sahle, C. Roméro, G. Lelong, J.-P. Rueff