[Ifeffit] Ifeffit Digest, Vol 167, Issue 2

[Bruce Ravel]

On 01/03/2017 03:32 PM, Raj kumar wrote:
> From XRD, it is confirmed that there is no side phase formation and
> contamination. Hence, i guess the heavier element role could be avoided
> here.

Raj,

While this might be true for your sample, in general, a statement like 
this always concerns me.

 From XRD, you can say is that there is no /crystalline/ side phase 
formation and that there is no contamination in the /diffracting/ 
/portion/ of the sample.

It is very common when preparing nanoparticulate matter for there to be 
non- or poorly-diffracting content in the sample.  If that content 
contains the absorbing element, then it will have an impact on the XAS data.

B



-- 
  Bruce Ravel  ------------------------------------ bravel at bnl.gov

  National Institute of Standards and Technology
  Synchrotron Science Group at NSLS-II
  Building 743, Room 114
  Upton NY, 11973

  Homepage:    http://bruceravel.github.io/home/
  Software:    https://github.com/bruceravel
  Demeter:     http://bruceravel.github.io/demeter/