[Ifeffit] Basic EXAFS question

Matt Newville newville at cars.uchicago.edu
Thu Jun 27 09:11:26 CDT 2013

Hi Darren,

On Thu, Jun 27, 2013 at 8:48 AM, Darren Dale <dsdale24 at gmail.com> wrote:
> Hello All,
> If I have a Ta(1-x)Ge(x)O(y) thin film, with Germanium concentration
> of a few percent, is it possible in principle to get useable
> fluorescence-mode EXAFS spectra around the Ge K edge (11.1 keV)? Or is
> it likely that the spectra would be complicated by additional Ge
> fluorescence excited by processes triggered by Tantalum L edge
> absorption (9.88, 11.13, 11.68 keV)?
> Thanks,
> Darren

Ack -- I think the Ta L2 edge (33 eV above Ge K edge) is going to make
that very hard.  You might be able to isolate Ge Kalpha from the Ta L
lines with a crystal analyzer, but the change in penetration depth at
the Ta L2 edge is going be huge, unless the film is much much less
than an absorption length.


More information about the Ifeffit mailing list