The sample was a 25 mm diameter 2000Å thick Cu(111) film grown
epitaxially by vapor deposition onto freshly cleaved mica. The c-axis
mosaic spread of the film was about 
FWHM, making it relatively
easy to track the Bragg peak versus energy. A thin sample was chosen to
minimize the effects of sample x-ray absorption. The diffracted intensities
at 8500 eV, about 500 eV below the edge, were 
photons per
second for the Cu(111) Bragg reflection and 
photons per
second for the Cu(222) reflection. Relative to the incident intensity, the
diffracted intensities were 
and 
for these two Bragg
reflections, and the diffracted intensities were well described by the
kinematic approximation.
The measured intensities versus energy for the Cu(111) and Cu(222) Bragg
reflections are shown in Fig. 5a together with the corresponding
fluorescence XAFS signal for comparison. The cusp in the Bragg intensity
drops at the edge energy, 
eV, to about 
of the pre-edge
intensity at 8500 eV for the Cu(111) reflection and to about 
for the
Cu(222) reflection. This difference in the relative cusp drop between the two
reflections is caused by the decrease in 
with 
. The fine
structure oscillations above the absorption edge are present in both the DAFS
and XAFS signals and have similar sizes, 
peak-to-peak, when normalized
to their corresponding cusp drop or edge step sizes.