Hi all!<br>I have performed two independent XAFS measurements of Cr K-edge of the same Fe-Cr sample at two different beam-lines at SSRL. I have obtained the Fe-K edge data only once. The quality of data are different in each measurement. However, I cannot average spectra from different Cr-K measurements, and I don&#39;t know if I could take somehow advantage from having almost twice the information for the Cr- K adge, or I have to use only the better quality data and discard the other. What do you advice? If I can use both measurements, how can I do the fitting in Artemis?<br>
Thank you very much and all take care<br clear="all"><br>-- <br>María Elena<br><br>Dra. María Elena Montero Cabrera<br>Departamento de Medio Ambiente y Energía<br>Centro de Investigación en Materiales Avanzados (CIMAV)<br>
Miguel de Cervantes 120, Compl. Ind. Chihuahua<br>Chihuahua CP 31109, Chih. México<br>Tel (614) 4391123<br>