Hi all,<br><br>I am performing EXAFS measurements on amorphous Indium Zinc Oxide (In and Zn edges) thin films and have a question about methods to break correlations.  We have the films grown at several compositions ranging from 50/50 to 90/10 (In/Zn wt.%).  We expect these films to display first NN shells very similar to their pure oxide cases, but the are interested in changes to the next-NN shells.  I was wondering if folks on the mailing had some good references on multiple data set fits using doping fractions to break correlations.  Would it be worth doing temperature dependent (or perhaps just cold) measurements to try and break correlations that way?<br>
<br>Another couple unrelated questions... I am running iXAFS 2.1 b1, is there any way to update the Athena/Artemis versions, or would I have to an source install?  Does anyone have an Athena plugin for the SSRL data Collector v2.0?  The SSRL plugins available make the program crash when I try and use them. (moderators, let me know if these questions should have been in a separate posting)<br>
<br>Regards,<br>Brandon <br>