Hi Pinit,

here is what you can expect from a SDD:

"At X-ray energies greater than silicon K absorption edge, which we have measured for crystalline silicon to be 1839 eV, the response function of the device shows two distinct peaks in addition to the primary one. One of them at energy Ef = 1739 eV is due to the silicon fluorescent photons that have escaped far enough from the original site of interaction to be detected as a separate event. The other peak centered at energy Ee = E0 - Ef, where E0 is energy of the incident photon, is called an escape peak."

So, indeed this shouldn't be a concern if you had a perfect rejection of harmonics on your beamline; if not, inelastic scattering of harmonic by the sample, even rejected by energy analysis,  should likely induce internal fluorescence and escape peaks not observed in TM. Just an hypothesis, but easy to check: presence or not of harmonic in your scattering.

Pierre

Le 02/02/2016 23:41, ifeffit-request@millenia.cars.aps.anl.gov a écrit :
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Message: 1
Date: Tue, 2 Feb 2016 15:30:45 -0500
From: Bruce Ravel <bravel@bnl.gov>
To: pinit <pinit@slri.or.th>
Cc: XAFS Analysis using Ifeffit <ifeffit@millenia.cars.aps.anl.gov>
Subject: Re: [Ifeffit] Could you please give me some information?
Message-ID: <56B111F5.7050108@bnl.gov>
Content-Type: text/plain; charset=windows-1252; format=flowed

On 02/01/2016 11:58 PM, pinit wrote:

Dear Bruce,

I am Pinit from SLRI, Thailand. I have some questions concerning the
Si-drift detector.

Could you give me some suggestions if Si-detector can detect the
corrected Si K-edge or not? This is because I have seen a significant
EXAFS signal (higher in amplitude in FT) measured by Si-drift detector
differs from Lytle detector or ionization chambers (TM mode).

Hi Pinit,

Nice to hear from you.  I am CCing my answer to the Ifeffit Mailing
List.  Someone else may have more insight into your question than I
do.  You should CC the list in your response.

I'd probably need to know more about the sample and the nature of the
measurement you made to understand why you are seeing a different
signal with the Si drift detector.

Normally one would expect that he EXAFS would be /attenuated/ either
due to self-absorption or due to the energy dependence of the I0
detector.  That you are seeing a larger EXAFS signal with the Si-drift
seems surprising.

One thing that occurs to me is that the Compton and elastic peaks
probably overlap the Si K alpha ROI quite a bit, even extending into
the EXAFS region.  I would have thought that, too, would serve to
attenuate the EXAFS (but maybe I am thinking about that wrongly).

Perhaps it would help to show us some of the data...?

B






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