Dear all,

I got XAFS data for Ag with CO adsorption( using Ag K edge), Ag is thin film~300nm deposited on Si/SiO2 substrate. But in the original μ(E) spectra, from 25894-26044eV, four obvious diffraction peaks appear( I attached the file), and I guess they will influence the quality of fitting. Is there anyone who knows how to deal with these diffraction peak? Will it be corrected by smoothing or changing some origin data points in the original file? I want the modification that will not destroy data analysis later.

Thanks for your help.

 

Tian Zhaomo

M.S. candidate

 

 

Lab. For Photosynthesis Materials and Devices

Department of Materials Science and Engineeing,POSTECH

san 31, Hyoja-Dong, Nam-Gu,
Pohang, 790-784, Republic of Korea

 

office: +82-54-279-2827

mobile: +82-10-7747-3790

e-mail: zhaomo1989@postech.ac.kr